Dual-comb spectrometer
Utilizing dual-comb spectroscopy! It is expected to be used for evaluating the physical properties of materials such as optical components and crystals.
The "Dual-comb Spectroscopy Measurement Device" uses dual-comb spectroscopy, a type of Fourier spectroscopy, to measure the optical delay of interference waveforms. From the optical delay of the interference waveforms and the thickness of the sample, the complex refractive index spectrum of the sample is obtained. It is expected to be utilized for the evaluation of the physical properties of materials such as optical components and crystals. This product was developed based on the results of the JST, ERATO Minoshima Intelligent Light Synthesizer Project. 【Features】 ■ Measures the optical delay of interference waveforms using dual-comb spectroscopy ■ Obtains the complex refractive index spectrum of the sample from the optical delay of the interference waveforms and the thickness of the sample ■ Expected to be useful for evaluating the physical properties of materials such as optical components and crystals ■ Developed based on the results of the JST, ERATO Minoshima Intelligent Light Synthesizer Project *For more details, please refer to the PDF document or feel free to contact us.
- 企業：ネオアーク 東京営業部
- 価格：Other
